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test probe
IEC61032 Deformed Articulated Test Probe B
- Standard: IEC61032
- Finger diameter:12mm
- Baffle diameter:50mm
- Material: Stainless steel
- Product description:IEC61032 Deformed Articulated Test Probe B, also called jointed test finger, used to verify protection against access to hazardous live parts, stainless steel material, comply with IEC61032 standard.
IEC61032 Deformed Articulated Test Probe B
Application: IEC61032 Test Probe B (articulated test finger) simulates human finger, used to verify the basic protection against access to hazardous live parts of electrical products, meet IP2X protection test requirements. It complies with IEC61032, IEC60335, IEC60950 standards.
Technical Parameters:
- Finger diameter:12mm
- Baffle diameter:50mm
- Material: Stainless steel
- Standard: IEC61032 Figure 2
- Color: White handle
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+86-14775548318