IEC60065 fig B1 12mm circle tips test probe finger

Application:

The test probe meets the requirements of IEC 60065 figure B1 & IEC 62151 figure 3 and is used to simulate fingers in the test. It is mainly used to prevent the proximity of dangerous parts when the external force is applied.

Standard:

IEC60950 Figure 2C, IEC60065 Figure B1, IEC62151 Figure 3, UL6500 Figure B.1

Function:

Test refers to whether the exposed parts of the TNV circuit of the information technology equipment are adequately protected

Technical Parameter:

Test method:

1.The 12mm metal part of the test probe cannot touch the live parts or the dangerous parts, and the 50mm-type baffle cannot enter.

2.In the test requirements to prevent access to hazardous parts, the test probe needs to apply thrust.